Characterization of hot-carrier degradation in non-isolated MOSFETs using a new gate-current measurement technique
Proceedings of the International Symposium on the Physical 7 Failure Analysis of Integrated Circuits, IPFA
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| Main Authors: | , , |
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| Other Authors: | |
| Format: | Conference or Workshop Item |
| Published: |
2014
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| Online Access: | http://scholarbank.nus.edu.sg/handle/10635/81386 |
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| Institution: | National University of Singapore |