New purely-experimental technique for extracting the spatial distribution of hot-carrier-induced interface states and trapped charges in MOSFETs

by Leang, S.E., Chan, D.S.H., Chim, W.K.
Published 2014

A new gate current measurement technique for the characterization of hot-carrier induced degradation in MOSFETs

by Leang, S.E., Chim, W.K., Chan, D.S.H.
Published 2014

Extraction of metal-oxide-semiconductor field-effect-transistor interface state and trapped charge spatial distributions using a physics-based algorithm

by Chim, W.K., Leang, S.E., Chan, D.S.H.
Published 2014

Characterization of hot-carrier degradation in non-isolated MOSFETs using a new gate-current measurement technique

by Leang, S.E., Chan, D.S.H., Chim, W.K.
Published 2014

Investigation of the role of hot holes and hot electrons in the generation of interface states in submicrometre MOSFETs using a new charge-profiling technique based on charge-pumpi...

by Chan, D.S.H., Leang, S.E., Chim, W.K.
Published 2014

Comparative study of charge trapping effects in LDD surface-channel and buried-channel PMOS transistors using charge profiling and threshold voltage shift measurements

by Kok, C.K., Chew, W.C., Chim, W.K., Chan, D.S.H., Leang, S.E.
Published 2014

Distinguishing the effects of oxide trapped charges and interface states in DDD and LATID nMOSFETs using photon emission spectroscopy

by Chim, W.K., Chan, D.S.H., Tao, J.M., Lou, C.L., Leang, S.E., Teow, C.K.
Published 2014

Integrated (automated) photon emission microscope and MOSFET characterization system for combined microscopic and macroscopic device analysis

by Ng, T.H., Chim, W.K., Chan, D.S.H., Phang, J.C.H., Liu, Y.Y., Lou, C.L., Leang, S.E., Tao, J.M.
Published 2014