Effects of strain relaxation in Pr0.67Sr0.33MnO3 films probed by polarization dependent X-ray absorption near edge structure

10.1038/srep19886

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Bibliographic Details
Main Authors:	Zhang, B, Chen, J, Yang, P, Chi, X, Lin, W, Venkatesan, T, Sun, C.-J, Heald, S.M, Chow, G.M
Other Authors:	ELECTRICAL AND COMPUTER ENGINEERING
Format:	Article
Published:	Nature Publishing Group 2020
Subjects:	anisotropy crystal structure geometry leisure polarization probability rotation thickness X ray X ray diffraction
Online Access:	https://scholarbank.nus.edu.sg/handle/10635/175434
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Institution:	National University of Singapore

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