Effects of strain relaxation in Pr0.67Sr0.33MnO3 films probed by polarization dependent X-ray absorption near edge structure

10.1038/srep19886

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Main Authors: Zhang, B, Chen, J, Yang, P, Chi, X, Lin, W, Venkatesan, T, Sun, C.-J, Heald, S.M, Chow, G.M
Other Authors: ELECTRICAL AND COMPUTER ENGINEERING
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Published: Nature Publishing Group 2020
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Online Access:https://scholarbank.nus.edu.sg/handle/10635/175434
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spelling sg-nus-scholar.10635-1754342024-04-24T09:57:08Z Effects of strain relaxation in Pr0.67Sr0.33MnO3 films probed by polarization dependent X-ray absorption near edge structure Zhang, B Chen, J Yang, P Chi, X Lin, W Venkatesan, T Sun, C.-J Heald, S.M Chow, G.M ELECTRICAL AND COMPUTER ENGINEERING SINGAPORE SYNCHROTRON LIGHT SOURCE CHEMISTRY MATERIALS SCIENCE AND ENGINEERING anisotropy crystal structure geometry leisure polarization probability rotation thickness X ray X ray diffraction 10.1038/srep19886 Scientific Reports 6 19886 2020-09-10T01:40:01Z 2020-09-10T01:40:01Z 2016 Article Zhang, B, Chen, J, Yang, P, Chi, X, Lin, W, Venkatesan, T, Sun, C.-J, Heald, S.M, Chow, G.M (2016). Effects of strain relaxation in Pr0.67Sr0.33MnO3 films probed by polarization dependent X-ray absorption near edge structure. Scientific Reports 6 : 19886. ScholarBank@NUS Repository. https://doi.org/10.1038/srep19886 20452322 https://scholarbank.nus.edu.sg/handle/10635/175434 Nature Publishing Group Unpaywall 20200831
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
topic anisotropy
crystal structure
geometry
leisure
polarization
probability
rotation
thickness
X ray
X ray diffraction
spellingShingle anisotropy
crystal structure
geometry
leisure
polarization
probability
rotation
thickness
X ray
X ray diffraction
Zhang, B
Chen, J
Yang, P
Chi, X
Lin, W
Venkatesan, T
Sun, C.-J
Heald, S.M
Chow, G.M
Effects of strain relaxation in Pr0.67Sr0.33MnO3 films probed by polarization dependent X-ray absorption near edge structure
description 10.1038/srep19886
author2 ELECTRICAL AND COMPUTER ENGINEERING
author_facet ELECTRICAL AND COMPUTER ENGINEERING
Zhang, B
Chen, J
Yang, P
Chi, X
Lin, W
Venkatesan, T
Sun, C.-J
Heald, S.M
Chow, G.M
format Article
author Zhang, B
Chen, J
Yang, P
Chi, X
Lin, W
Venkatesan, T
Sun, C.-J
Heald, S.M
Chow, G.M
author_sort Zhang, B
title Effects of strain relaxation in Pr0.67Sr0.33MnO3 films probed by polarization dependent X-ray absorption near edge structure
title_short Effects of strain relaxation in Pr0.67Sr0.33MnO3 films probed by polarization dependent X-ray absorption near edge structure
title_full Effects of strain relaxation in Pr0.67Sr0.33MnO3 films probed by polarization dependent X-ray absorption near edge structure
title_fullStr Effects of strain relaxation in Pr0.67Sr0.33MnO3 films probed by polarization dependent X-ray absorption near edge structure
title_full_unstemmed Effects of strain relaxation in Pr0.67Sr0.33MnO3 films probed by polarization dependent X-ray absorption near edge structure
title_sort effects of strain relaxation in pr0.67sr0.33mno3 films probed by polarization dependent x-ray absorption near edge structure
publisher Nature Publishing Group
publishDate 2020
url https://scholarbank.nus.edu.sg/handle/10635/175434
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