STATIC CURRENT AND VOLTAGE TECHNIQUES FOR CMOS RELIABILITY CHARACTERIZATION
Ph.D
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sg-nus-scholar.10635-1758702020-11-19T13:57:15Z STATIC CURRENT AND VOLTAGE TECHNIQUES FOR CMOS RELIABILITY CHARACTERIZATION JIE BIN BIN ELECTRICAL ENGINEERING LI MING FU Ph.D DOCTOR OF PHILOSOPHY 2020-09-11T04:42:37Z 2020-09-11T04:42:37Z 1999 Thesis JIE BIN BIN (1999). STATIC CURRENT AND VOLTAGE TECHNIQUES FOR CMOS RELIABILITY CHARACTERIZATION. ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/175870 CCK BATCHLOAD 20200918 |
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National University of Singapore |
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Asia |
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Singapore Singapore |
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description |
Ph.D |
author2 |
ELECTRICAL ENGINEERING |
author_facet |
ELECTRICAL ENGINEERING JIE BIN BIN |
format |
Theses and Dissertations |
author |
JIE BIN BIN |
spellingShingle |
JIE BIN BIN STATIC CURRENT AND VOLTAGE TECHNIQUES FOR CMOS RELIABILITY CHARACTERIZATION |
author_sort |
JIE BIN BIN |
title |
STATIC CURRENT AND VOLTAGE TECHNIQUES FOR CMOS RELIABILITY CHARACTERIZATION |
title_short |
STATIC CURRENT AND VOLTAGE TECHNIQUES FOR CMOS RELIABILITY CHARACTERIZATION |
title_full |
STATIC CURRENT AND VOLTAGE TECHNIQUES FOR CMOS RELIABILITY CHARACTERIZATION |
title_fullStr |
STATIC CURRENT AND VOLTAGE TECHNIQUES FOR CMOS RELIABILITY CHARACTERIZATION |
title_full_unstemmed |
STATIC CURRENT AND VOLTAGE TECHNIQUES FOR CMOS RELIABILITY CHARACTERIZATION |
title_sort |
static current and voltage techniques for cmos reliability characterization |
publishDate |
2020 |
url |
https://scholarbank.nus.edu.sg/handle/10635/175870 |
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1686108918444457984 |