STATIC CURRENT AND VOLTAGE TECHNIQUES FOR CMOS RELIABILITY CHARACTERIZATION

Ph.D

Saved in:
Bibliographic Details
Main Author: JIE BIN BIN
Other Authors: ELECTRICAL ENGINEERING
Format: Theses and Dissertations
Published: 2020
Online Access:https://scholarbank.nus.edu.sg/handle/10635/175870
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore
id sg-nus-scholar.10635-175870
record_format dspace
spelling sg-nus-scholar.10635-1758702020-11-19T13:57:15Z STATIC CURRENT AND VOLTAGE TECHNIQUES FOR CMOS RELIABILITY CHARACTERIZATION JIE BIN BIN ELECTRICAL ENGINEERING LI MING FU Ph.D DOCTOR OF PHILOSOPHY 2020-09-11T04:42:37Z 2020-09-11T04:42:37Z 1999 Thesis JIE BIN BIN (1999). STATIC CURRENT AND VOLTAGE TECHNIQUES FOR CMOS RELIABILITY CHARACTERIZATION. ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/175870 CCK BATCHLOAD 20200918
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description Ph.D
author2 ELECTRICAL ENGINEERING
author_facet ELECTRICAL ENGINEERING
JIE BIN BIN
format Theses and Dissertations
author JIE BIN BIN
spellingShingle JIE BIN BIN
STATIC CURRENT AND VOLTAGE TECHNIQUES FOR CMOS RELIABILITY CHARACTERIZATION
author_sort JIE BIN BIN
title STATIC CURRENT AND VOLTAGE TECHNIQUES FOR CMOS RELIABILITY CHARACTERIZATION
title_short STATIC CURRENT AND VOLTAGE TECHNIQUES FOR CMOS RELIABILITY CHARACTERIZATION
title_full STATIC CURRENT AND VOLTAGE TECHNIQUES FOR CMOS RELIABILITY CHARACTERIZATION
title_fullStr STATIC CURRENT AND VOLTAGE TECHNIQUES FOR CMOS RELIABILITY CHARACTERIZATION
title_full_unstemmed STATIC CURRENT AND VOLTAGE TECHNIQUES FOR CMOS RELIABILITY CHARACTERIZATION
title_sort static current and voltage techniques for cmos reliability characterization
publishDate 2020
url https://scholarbank.nus.edu.sg/handle/10635/175870
_version_ 1686108918444457984