Elucidating potential-induced degradation in bifacial PERC silicon photovoltaic modules
10.1002/pip.3028
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sg-nus-scholar.10635-1768422024-04-04T02:34:06Z Elucidating potential-induced degradation in bifacial PERC silicon photovoltaic modules LUO WEI Hacke, Peter Terwilliger, Kent LIANG TIAN SHEN WANG YAN SEERAM RAMAKRISHNA ABERLE,ARMIN GERHARD KHOO YONG SHENG DEPT OF ELECTRICAL & COMPUTER ENGG MECHANICAL ENGINEERING SOLAR ENERGY RESEARCH INST OF S'PORE Science & Technology Technology Physical Sciences Energy & Fuels Materials Science, Multidisciplinary Physics, Applied Materials Science Physics bifacial PERC silicon solar cell light-induced recovery photovoltaic module reliability potential-induced degradation surface passivation degradation STACKING-FAULTS VOLTAGE EXPLANATION TEMPERATURE IMPACT LEVEL 10.1002/pip.3028 PROGRESS IN PHOTOVOLTAICS 26 10 859-867 2020-09-29T02:40:31Z 2020-09-29T02:40:31Z 2018-10-01 2020-09-28T14:26:28Z Article LUO WEI, Hacke, Peter, Terwilliger, Kent, LIANG TIAN SHEN, WANG YAN, SEERAM RAMAKRISHNA, ABERLE,ARMIN GERHARD, KHOO YONG SHENG (2018-10-01). Elucidating potential-induced degradation in bifacial PERC silicon photovoltaic modules. PROGRESS IN PHOTOVOLTAICS 26 (10) : 859-867. ScholarBank@NUS Repository. https://doi.org/10.1002/pip.3028 1062-7995 1099-159X https://scholarbank.nus.edu.sg/handle/10635/176842 en WILEY Elements |
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Science & Technology Technology Physical Sciences Energy & Fuels Materials Science, Multidisciplinary Physics, Applied Materials Science Physics bifacial PERC silicon solar cell light-induced recovery photovoltaic module reliability potential-induced degradation surface passivation degradation STACKING-FAULTS VOLTAGE EXPLANATION TEMPERATURE IMPACT LEVEL |
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Science & Technology Technology Physical Sciences Energy & Fuels Materials Science, Multidisciplinary Physics, Applied Materials Science Physics bifacial PERC silicon solar cell light-induced recovery photovoltaic module reliability potential-induced degradation surface passivation degradation STACKING-FAULTS VOLTAGE EXPLANATION TEMPERATURE IMPACT LEVEL LUO WEI Hacke, Peter Terwilliger, Kent LIANG TIAN SHEN WANG YAN SEERAM RAMAKRISHNA ABERLE,ARMIN GERHARD KHOO YONG SHENG Elucidating potential-induced degradation in bifacial PERC silicon photovoltaic modules |
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10.1002/pip.3028 |
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DEPT OF ELECTRICAL & COMPUTER ENGG |
author_facet |
DEPT OF ELECTRICAL & COMPUTER ENGG LUO WEI Hacke, Peter Terwilliger, Kent LIANG TIAN SHEN WANG YAN SEERAM RAMAKRISHNA ABERLE,ARMIN GERHARD KHOO YONG SHENG |
format |
Article |
author |
LUO WEI Hacke, Peter Terwilliger, Kent LIANG TIAN SHEN WANG YAN SEERAM RAMAKRISHNA ABERLE,ARMIN GERHARD KHOO YONG SHENG |
author_sort |
LUO WEI |
title |
Elucidating potential-induced degradation in bifacial PERC silicon photovoltaic modules |
title_short |
Elucidating potential-induced degradation in bifacial PERC silicon photovoltaic modules |
title_full |
Elucidating potential-induced degradation in bifacial PERC silicon photovoltaic modules |
title_fullStr |
Elucidating potential-induced degradation in bifacial PERC silicon photovoltaic modules |
title_full_unstemmed |
Elucidating potential-induced degradation in bifacial PERC silicon photovoltaic modules |
title_sort |
elucidating potential-induced degradation in bifacial perc silicon photovoltaic modules |
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WILEY |
publishDate |
2020 |
url |
https://scholarbank.nus.edu.sg/handle/10635/176842 |
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1800914427020574720 |