Elucidating potential-induced degradation in bifacial PERC silicon photovoltaic modules
10.1002/pip.3028
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2020
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sg-nus-scholar.10635-1768422024-11-14T10:33:30Z Elucidating potential-induced degradation in bifacial PERC silicon photovoltaic modules LUO WEI Hacke, Peter Terwilliger, Kent LIANG TIAN SHEN WANG YAN SEERAM RAMAKRISHNA ABERLE,ARMIN GERHARD KHOO YONG SHENG ELECTRICAL AND COMPUTER ENGINEERING SOLAR ENERGY RESEARCH INST OF S'PORE MECHANICAL ENGINEERING Dr Wei Luo Science & Technology Technology Physical Sciences Energy & Fuels Materials Science, Multidisciplinary Physics, Applied Materials Science Physics bifacial PERC silicon solar cell light-induced recovery photovoltaic module reliability potential-induced degradation surface passivation degradation STACKING-FAULTS VOLTAGE EXPLANATION TEMPERATURE IMPACT LEVEL 10.1002/pip.3028 PROGRESS IN PHOTOVOLTAICS 26 10 859-867 2020-09-29T02:40:31Z 2020-09-29T02:40:31Z 2018-10-01 2020-09-28T14:26:28Z Article LUO WEI, Hacke, Peter, Terwilliger, Kent, LIANG TIAN SHEN, WANG YAN, SEERAM RAMAKRISHNA, ABERLE,ARMIN GERHARD, KHOO YONG SHENG (2018-10-01). Elucidating potential-induced degradation in bifacial PERC silicon photovoltaic modules. PROGRESS IN PHOTOVOLTAICS 26 (10) : 859-867. ScholarBank@NUS Repository. https://doi.org/10.1002/pip.3028 1062-7995 1099-159X https://scholarbank.nus.edu.sg/handle/10635/176842 en WILEY Elements |
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Science & Technology Technology Physical Sciences Energy & Fuels Materials Science, Multidisciplinary Physics, Applied Materials Science Physics bifacial PERC silicon solar cell light-induced recovery photovoltaic module reliability potential-induced degradation surface passivation degradation STACKING-FAULTS VOLTAGE EXPLANATION TEMPERATURE IMPACT LEVEL |
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Science & Technology Technology Physical Sciences Energy & Fuels Materials Science, Multidisciplinary Physics, Applied Materials Science Physics bifacial PERC silicon solar cell light-induced recovery photovoltaic module reliability potential-induced degradation surface passivation degradation STACKING-FAULTS VOLTAGE EXPLANATION TEMPERATURE IMPACT LEVEL LUO WEI Hacke, Peter Terwilliger, Kent LIANG TIAN SHEN WANG YAN SEERAM RAMAKRISHNA ABERLE,ARMIN GERHARD KHOO YONG SHENG Elucidating potential-induced degradation in bifacial PERC silicon photovoltaic modules |
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10.1002/pip.3028 |
author2 |
ELECTRICAL AND COMPUTER ENGINEERING |
author_facet |
ELECTRICAL AND COMPUTER ENGINEERING LUO WEI Hacke, Peter Terwilliger, Kent LIANG TIAN SHEN WANG YAN SEERAM RAMAKRISHNA ABERLE,ARMIN GERHARD KHOO YONG SHENG |
format |
Article |
author |
LUO WEI Hacke, Peter Terwilliger, Kent LIANG TIAN SHEN WANG YAN SEERAM RAMAKRISHNA ABERLE,ARMIN GERHARD KHOO YONG SHENG |
author_sort |
LUO WEI |
title |
Elucidating potential-induced degradation in bifacial PERC silicon photovoltaic modules |
title_short |
Elucidating potential-induced degradation in bifacial PERC silicon photovoltaic modules |
title_full |
Elucidating potential-induced degradation in bifacial PERC silicon photovoltaic modules |
title_fullStr |
Elucidating potential-induced degradation in bifacial PERC silicon photovoltaic modules |
title_full_unstemmed |
Elucidating potential-induced degradation in bifacial PERC silicon photovoltaic modules |
title_sort |
elucidating potential-induced degradation in bifacial perc silicon photovoltaic modules |
publisher |
WILEY |
publishDate |
2020 |
url |
https://scholarbank.nus.edu.sg/handle/10635/176842 |
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1821188504943591424 |