Elucidating potential-induced degradation in bifacial PERC silicon photovoltaic modules

• Main Authors: LUO WEI, Hacke, Peter, Terwilliger, Kent, LIANG TIAN SHEN, WANG YAN, SEERAM RAMAKRISHNA, ABERLE,ARMIN GERHARD, KHOO YONG SHENG
• Other Authors: DEPT OF ELECTRICAL & COMPUTER ENGG
• Format: Article
• Language: English
• Published: WILEY 2020
• Subjects: Science & Technology; Technology; Physical Sciences; Energy & Fuels; Materials Science, Multidisciplinary; Physics, Applied; Materials Science; Physics; bifacial PERC silicon solar cell; light-induced recovery; photovoltaic module reliability; potential-induced degradation; surface passivation degradation; STACKING-FAULTS; VOLTAGE; EXPLANATION; TEMPERATURE; IMPACT; LEVEL
• Online Access: https://scholarbank.nus.edu.sg/handle/10635/176842
• Institution: National University of Singapore

10.1002/pip.3028