A Bayesian optimal design for accelerated degradation tests

A Bayesian optimal design for accelerated degradation tests

10.1002/qre.1151

Saved in:
Bibliographic Details
Main Authors: Liu, X., Tang, L.-C.
Other Authors: INDUSTRIAL & SYSTEMS ENGINEERING
Format: Article
Published: 2014
Subjects:
Accelerated degradation test
Bayesian optimal design
Gibbs sampler
Hot-carrier-induced degradation
Monte Carlo simulation
Physically based statistical model
Online Access:http://scholarbank.nus.edu.sg/handle/10635/53895
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore

Internet

http://scholarbank.nus.edu.sg/handle/10635/53895

Similar Items