Planning of step-stress accelerated degradation test

Planning of step-stress accelerated degradation test

Proceedings of the Annual Reliability and Maintainability Symposium

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Bibliographic Details
Main Authors: Tang, L.C., Yang, G.Y., Xie, M.
Other Authors: INDUSTRIAL & SYSTEMS ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Subjects:
Accelerated testing
Degradation
Highly reliable product
Optimal plan
Reliability estimation
Online Access:http://scholarbank.nus.edu.sg/handle/10635/72377
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Institution: National University of Singapore

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http://scholarbank.nus.edu.sg/handle/10635/72377

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