ELECTRICAL AND STRUCTURAL CHARACTERISATIONS OF RAPID THERMAL ANNEALED SILICON : SILICON OXIDE SYSTEMS

Ph.D

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Main Author:	CHAN YEE MING
Other Authors:	ELECTRICAL ENGINEERING
Format:	Theses and Dissertations
Published:	2020
Online Access:	https://scholarbank.nus.edu.sg/handle/10635/177860
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Institution:	National University of Singapore

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spelling	sg-nus-scholar.10635-1778602020-11-19T13:57:16Z ELECTRICAL AND STRUCTURAL CHARACTERISATIONS OF RAPID THERMAL ANNEALED SILICON : SILICON OXIDE SYSTEMS CHAN YEE MING ELECTRICAL ENGINEERING CHOI WEE KIONG Ph.D DOCTOR OF PHILOSOPHY 2020-10-20T03:49:46Z 2020-10-20T03:49:46Z 1997 Thesis CHAN YEE MING (1997). ELECTRICAL AND STRUCTURAL CHARACTERISATIONS OF RAPID THERMAL ANNEALED SILICON : SILICON OXIDE SYSTEMS. ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/177860 CCK BATCHLOAD 20201023
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	Ph.D
author2	ELECTRICAL ENGINEERING
author_facet	ELECTRICAL ENGINEERING CHAN YEE MING
format	Theses and Dissertations
author	CHAN YEE MING
spellingShingle	CHAN YEE MING ELECTRICAL AND STRUCTURAL CHARACTERISATIONS OF RAPID THERMAL ANNEALED SILICON : SILICON OXIDE SYSTEMS
author_sort	CHAN YEE MING
title	ELECTRICAL AND STRUCTURAL CHARACTERISATIONS OF RAPID THERMAL ANNEALED SILICON : SILICON OXIDE SYSTEMS
title_short	ELECTRICAL AND STRUCTURAL CHARACTERISATIONS OF RAPID THERMAL ANNEALED SILICON : SILICON OXIDE SYSTEMS
title_full	ELECTRICAL AND STRUCTURAL CHARACTERISATIONS OF RAPID THERMAL ANNEALED SILICON : SILICON OXIDE SYSTEMS
title_fullStr	ELECTRICAL AND STRUCTURAL CHARACTERISATIONS OF RAPID THERMAL ANNEALED SILICON : SILICON OXIDE SYSTEMS
title_full_unstemmed	ELECTRICAL AND STRUCTURAL CHARACTERISATIONS OF RAPID THERMAL ANNEALED SILICON : SILICON OXIDE SYSTEMS
title_sort	electrical and structural characterisations of rapid thermal annealed silicon : silicon oxide systems
publishDate	2020
url	https://scholarbank.nus.edu.sg/handle/10635/177860
_version_	1686108957541662720

ELECTRICAL AND STRUCTURAL CHARACTERISATIONS OF RAPID THERMAL ANNEALED SILICON : SILICON OXIDE SYSTEMS

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