EVALUATION OF HOT-CARRIER DEGRADATION IN SUBMICROMETRE MOSFETS BY GATE CAPACITANCE AND CHARGE PUMPING CURRENT MEASUREMENTS
Ph.D
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| Format: | Theses and Dissertations |
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2020
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| Online Access: | https://scholarbank.nus.edu.sg/handle/10635/177873 |
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sg-nus-scholar.10635-1778732020-11-19T13:57:16Z EVALUATION OF HOT-CARRIER DEGRADATION IN SUBMICROMETRE MOSFETS BY GATE CAPACITANCE AND CHARGE PUMPING CURRENT MEASUREMENTS TAN SUAT ENG ELECTRICAL ENGINEERING LING CHUNG HO Ph.D DOCTOR OF PHILOSOPHY 2020-10-20T03:50:15Z 2020-10-20T03:50:15Z 1997 Thesis TAN SUAT ENG (1997). EVALUATION OF HOT-CARRIER DEGRADATION IN SUBMICROMETRE MOSFETS BY GATE CAPACITANCE AND CHARGE PUMPING CURRENT MEASUREMENTS. ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/177873 CCK BATCHLOAD 20201023 |
| institution |
National University of Singapore |
| building |
NUS Library |
| continent |
Asia |
| country |
Singapore Singapore |
| content_provider |
NUS Library |
| collection |
ScholarBank@NUS |
| description |
Ph.D |
| author2 |
ELECTRICAL ENGINEERING |
| author_facet |
ELECTRICAL ENGINEERING TAN SUAT ENG |
| format |
Theses and Dissertations |
| author |
TAN SUAT ENG |
| spellingShingle |
TAN SUAT ENG EVALUATION OF HOT-CARRIER DEGRADATION IN SUBMICROMETRE MOSFETS BY GATE CAPACITANCE AND CHARGE PUMPING CURRENT MEASUREMENTS |
| author_sort |
TAN SUAT ENG |
| title |
EVALUATION OF HOT-CARRIER DEGRADATION IN SUBMICROMETRE MOSFETS BY GATE CAPACITANCE AND CHARGE PUMPING CURRENT MEASUREMENTS |
| title_short |
EVALUATION OF HOT-CARRIER DEGRADATION IN SUBMICROMETRE MOSFETS BY GATE CAPACITANCE AND CHARGE PUMPING CURRENT MEASUREMENTS |
| title_full |
EVALUATION OF HOT-CARRIER DEGRADATION IN SUBMICROMETRE MOSFETS BY GATE CAPACITANCE AND CHARGE PUMPING CURRENT MEASUREMENTS |
| title_fullStr |
EVALUATION OF HOT-CARRIER DEGRADATION IN SUBMICROMETRE MOSFETS BY GATE CAPACITANCE AND CHARGE PUMPING CURRENT MEASUREMENTS |
| title_full_unstemmed |
EVALUATION OF HOT-CARRIER DEGRADATION IN SUBMICROMETRE MOSFETS BY GATE CAPACITANCE AND CHARGE PUMPING CURRENT MEASUREMENTS |
| title_sort |
evaluation of hot-carrier degradation in submicrometre mosfets by gate capacitance and charge pumping current measurements |
| publishDate |
2020 |
| url |
https://scholarbank.nus.edu.sg/handle/10635/177873 |
| _version_ |
1686108959047417856 |