CARRIER LIFETIME CHARACTERIZATION TECHNIQUES IN SOI AND BULK SILICON

Ph.D

Saved in:

Bibliographic Details
Main Author:	CHENG ZHIYUAN
Other Authors:	ELECTRICAL ENGINEERING
Format:	Theses and Dissertations
Published:	2020
Online Access:	https://scholarbank.nus.edu.sg/handle/10635/179132
Tags:	Add Tag No Tags, Be the first to tag this record!
Institution:	National University of Singapore

id	sg-nus-scholar.10635-179132
record_format	dspace
spelling	sg-nus-scholar.10635-1791322020-11-19T13:57:17Z CARRIER LIFETIME CHARACTERIZATION TECHNIQUES IN SOI AND BULK SILICON CHENG ZHIYUAN ELECTRICAL ENGINEERING LING CHUNG HO Ph.D DOCTOR OF PHILOSOPHY 2020-10-22T09:37:44Z 2020-10-22T09:37:44Z 1999 Thesis CHENG ZHIYUAN (1999). CARRIER LIFETIME CHARACTERIZATION TECHNIQUES IN SOI AND BULK SILICON. ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/179132 CCK BATCHLOAD 20201023
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	Ph.D
author2	ELECTRICAL ENGINEERING
author_facet	ELECTRICAL ENGINEERING CHENG ZHIYUAN
format	Theses and Dissertations
author	CHENG ZHIYUAN
spellingShingle	CHENG ZHIYUAN CARRIER LIFETIME CHARACTERIZATION TECHNIQUES IN SOI AND BULK SILICON
author_sort	CHENG ZHIYUAN
title	CARRIER LIFETIME CHARACTERIZATION TECHNIQUES IN SOI AND BULK SILICON
title_short	CARRIER LIFETIME CHARACTERIZATION TECHNIQUES IN SOI AND BULK SILICON
title_full	CARRIER LIFETIME CHARACTERIZATION TECHNIQUES IN SOI AND BULK SILICON
title_fullStr	CARRIER LIFETIME CHARACTERIZATION TECHNIQUES IN SOI AND BULK SILICON
title_full_unstemmed	CARRIER LIFETIME CHARACTERIZATION TECHNIQUES IN SOI AND BULK SILICON
title_sort	carrier lifetime characterization techniques in soi and bulk silicon
publishDate	2020
url	https://scholarbank.nus.edu.sg/handle/10635/179132
_version_	1686109045800304640

Similar Items