Characterization of Thin Film Materials using SCAN meta-GGA, an Accurate Nonempirical Density Functional

Characterization of Thin Film Materials using SCAN meta-GGA, an Accurate Nonempirical Density Functional

10.1038/srep44766

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Bibliographic Details
Main Authors: Buda, I.G, Lane, C, Barbiellini, B, Ruzsinszky, A, Sun, J, Bansil, A
Other Authors: CENTRE FOR ADVANCED 2D MATERIALS
Format: Article
Published: Nature Publishing Group 2020
Online Access:https://scholarbank.nus.edu.sg/handle/10635/179728
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Institution: National University of Singapore

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https://scholarbank.nus.edu.sg/handle/10635/179728

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