Scanning near-field photon emission microscopy
Ph.D
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sg-nus-scholar.10635-179972017-10-21T08:33:47Z Scanning near-field photon emission microscopy ISAKOV DMITRY ELECTRICAL & COMPUTER ENGINEERING PHANG C H, JACOB LUDWIG JOSEF BALK ZHANG YING near-field microscopy, photon emission, probe, gallium, failure analysis, semiconductors Ph.D DOCTOR OF PHILOSOPHY 2010-09-03T18:00:46Z 2010-09-03T18:00:46Z 2010-01-06 Thesis ISAKOV DMITRY (2010-01-06). Scanning near-field photon emission microscopy. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/17997 NOT_IN_WOS en |
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National University of Singapore |
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ScholarBank@NUS |
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near-field microscopy, photon emission, probe, gallium, failure analysis, semiconductors |
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near-field microscopy, photon emission, probe, gallium, failure analysis, semiconductors ISAKOV DMITRY Scanning near-field photon emission microscopy |
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Ph.D |
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ELECTRICAL & COMPUTER ENGINEERING |
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ELECTRICAL & COMPUTER ENGINEERING ISAKOV DMITRY |
format |
Theses and Dissertations |
author |
ISAKOV DMITRY |
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ISAKOV DMITRY |
title |
Scanning near-field photon emission microscopy |
title_short |
Scanning near-field photon emission microscopy |
title_full |
Scanning near-field photon emission microscopy |
title_fullStr |
Scanning near-field photon emission microscopy |
title_full_unstemmed |
Scanning near-field photon emission microscopy |
title_sort |
scanning near-field photon emission microscopy |
publishDate |
2010 |
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http://scholarbank.nus.edu.sg/handle/10635/17997 |
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