FLICKER NOISE CHARACTERIZATION FOR TRAPPING EFFECTS IN SUBMICROMETER MOS TRANSISTORS

Master's

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Bibliographic Details
Main Author:	YEO BOON PIAN
Other Authors:	ELECTRICAL ENGINEERING
Format:	Theses and Dissertations
Published:	2020
Online Access:	https://scholarbank.nus.edu.sg/handle/10635/180020
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-180020
record_format	dspace
spelling	sg-nus-scholar.10635-1800202020-11-19T13:57:18Z FLICKER NOISE CHARACTERIZATION FOR TRAPPING EFFECTS IN SUBMICROMETER MOS TRANSISTORS YEO BOON PIAN ELECTRICAL ENGINEERING DANIEL CHAN SIU HUNG CHIM WAI KIN Master's MASTER OF ENGINEERING 2020-10-26T06:32:14Z 2020-10-26T06:32:14Z 1999 Thesis YEO BOON PIAN (1999). FLICKER NOISE CHARACTERIZATION FOR TRAPPING EFFECTS IN SUBMICROMETER MOS TRANSISTORS. ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/180020 CCK BATCHLOAD 20201023
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	Master's
author2	ELECTRICAL ENGINEERING
author_facet	ELECTRICAL ENGINEERING YEO BOON PIAN
format	Theses and Dissertations
author	YEO BOON PIAN
spellingShingle	YEO BOON PIAN FLICKER NOISE CHARACTERIZATION FOR TRAPPING EFFECTS IN SUBMICROMETER MOS TRANSISTORS
author_sort	YEO BOON PIAN
title	FLICKER NOISE CHARACTERIZATION FOR TRAPPING EFFECTS IN SUBMICROMETER MOS TRANSISTORS
title_short	FLICKER NOISE CHARACTERIZATION FOR TRAPPING EFFECTS IN SUBMICROMETER MOS TRANSISTORS
title_full	FLICKER NOISE CHARACTERIZATION FOR TRAPPING EFFECTS IN SUBMICROMETER MOS TRANSISTORS
title_fullStr	FLICKER NOISE CHARACTERIZATION FOR TRAPPING EFFECTS IN SUBMICROMETER MOS TRANSISTORS
title_full_unstemmed	FLICKER NOISE CHARACTERIZATION FOR TRAPPING EFFECTS IN SUBMICROMETER MOS TRANSISTORS
title_sort	flicker noise characterization for trapping effects in submicrometer mos transistors
publishDate	2020
url	https://scholarbank.nus.edu.sg/handle/10635/180020
_version_	1686109085558112256

FLICKER NOISE CHARACTERIZATION FOR TRAPPING EFFECTS IN SUBMICROMETER MOS TRANSISTORS

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