HOT-CARRIER EFFECTS IN THIN GATE OXIDE MOSFET'S

Master's

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Bibliographic Details
Main Author:	SEE LENG KIAN
Other Authors:	ELECTRICAL ENGINEERING
Format:	Theses and Dissertations
Published:	2020
Online Access:	https://scholarbank.nus.edu.sg/handle/10635/180689
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-180689
record_format	dspace
spelling	sg-nus-scholar.10635-1806892020-11-19T13:57:19Z HOT-CARRIER EFFECTS IN THIN GATE OXIDE MOSFET'S SEE LENG KIAN ELECTRICAL ENGINEERING LING CHUNG HO Master's MASTER OF ENGINEERING 2020-10-27T02:47:31Z 2020-10-27T02:47:31Z 1999 Thesis SEE LENG KIAN (1999). HOT-CARRIER EFFECTS IN THIN GATE OXIDE MOSFET'S. ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/180689 CCK BATCHLOAD 20201023
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	Master's
author2	ELECTRICAL ENGINEERING
author_facet	ELECTRICAL ENGINEERING SEE LENG KIAN
format	Theses and Dissertations
author	SEE LENG KIAN
spellingShingle	SEE LENG KIAN HOT-CARRIER EFFECTS IN THIN GATE OXIDE MOSFET'S
author_sort	SEE LENG KIAN
title	HOT-CARRIER EFFECTS IN THIN GATE OXIDE MOSFET'S
title_short	HOT-CARRIER EFFECTS IN THIN GATE OXIDE MOSFET'S
title_full	HOT-CARRIER EFFECTS IN THIN GATE OXIDE MOSFET'S
title_fullStr	HOT-CARRIER EFFECTS IN THIN GATE OXIDE MOSFET'S
title_full_unstemmed	HOT-CARRIER EFFECTS IN THIN GATE OXIDE MOSFET'S
title_sort	hot-carrier effects in thin gate oxide mosfet's
publishDate	2020
url	https://scholarbank.nus.edu.sg/handle/10635/180689
_version_	1686109131915657216

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