SCANNING ELECTRON MICROSCOPE INVESTIGATION OF CHARGING AND DISCHARGING BEHAVIOR IN INSULATIONS

Master's

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Bibliographic Details
Main Author:	CHEN HUI
Other Authors:	PHYSICS
Format:	Theses and Dissertations
Published:	2020
Online Access:	https://scholarbank.nus.edu.sg/handle/10635/182352
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-182352
record_format	dspace
spelling	sg-nus-scholar.10635-1823522024-10-25T20:01:41Z SCANNING ELECTRON MICROSCOPE INVESTIGATION OF CHARGING AND DISCHARGING BEHAVIOR IN INSULATIONS CHEN HUI PHYSICS ONG CHONG KIM Master's MASTER OF SCIENCE 2020-10-30T08:19:35Z 2020-10-30T08:19:35Z 1996 Thesis CHEN HUI (1996). SCANNING ELECTRON MICROSCOPE INVESTIGATION OF CHARGING AND DISCHARGING BEHAVIOR IN INSULATIONS. ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/182352 CCK BATCHLOAD 20201023
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	Master's
author2	PHYSICS
author_facet	PHYSICS CHEN HUI
format	Theses and Dissertations
author	CHEN HUI
spellingShingle	CHEN HUI SCANNING ELECTRON MICROSCOPE INVESTIGATION OF CHARGING AND DISCHARGING BEHAVIOR IN INSULATIONS
author_sort	CHEN HUI
title	SCANNING ELECTRON MICROSCOPE INVESTIGATION OF CHARGING AND DISCHARGING BEHAVIOR IN INSULATIONS
title_short	SCANNING ELECTRON MICROSCOPE INVESTIGATION OF CHARGING AND DISCHARGING BEHAVIOR IN INSULATIONS
title_full	SCANNING ELECTRON MICROSCOPE INVESTIGATION OF CHARGING AND DISCHARGING BEHAVIOR IN INSULATIONS
title_fullStr	SCANNING ELECTRON MICROSCOPE INVESTIGATION OF CHARGING AND DISCHARGING BEHAVIOR IN INSULATIONS
title_full_unstemmed	SCANNING ELECTRON MICROSCOPE INVESTIGATION OF CHARGING AND DISCHARGING BEHAVIOR IN INSULATIONS
title_sort	scanning electron microscope investigation of charging and discharging behavior in insulations
publishDate	2020
url	https://scholarbank.nus.edu.sg/handle/10635/182352
_version_	1821192066796879872

SCANNING ELECTRON MICROSCOPE INVESTIGATION OF CHARGING AND DISCHARGING BEHAVIOR IN INSULATIONS

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