SEEING STRUCTURAL ORIGINS AND FORESEEING NEW PATHWAYS TO IMPROVED FUNCTIONAL MATERIALS WITH ABERRATION -CORRECTED SCANNING TRANSMISSION ELECTRON MICROSCOPY (STEM)
Ph.D
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Format: | Theses and Dissertations |
Language: | English |
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2021
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Online Access: | https://scholarbank.nus.edu.sg/handle/10635/186832 |
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sg-nus-scholar.10635-1868322021-03-02T13:15:17Z SEEING STRUCTURAL ORIGINS AND FORESEEING NEW PATHWAYS TO IMPROVED FUNCTIONAL MATERIALS WITH ABERRATION -CORRECTED SCANNING TRANSMISSION ELECTRON MICROSCOPY (STEM) WU HAIJUN MATERIALS SCIENCE AND ENGINEERING Stephen John Pennycook aberration-corrected STEM, atomic-scale defects, piezoelectric, thermoelectric, polarization, interface Ph.D DOCTOR OF PHILOSOPHY (FOE) 2021-02-28T18:00:42Z 2021-02-28T18:00:42Z 2019-01-11 Thesis WU HAIJUN (2019-01-11). SEEING STRUCTURAL ORIGINS AND FORESEEING NEW PATHWAYS TO IMPROVED FUNCTIONAL MATERIALS WITH ABERRATION -CORRECTED SCANNING TRANSMISSION ELECTRON MICROSCOPY (STEM). ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/186832 0000-0002-7303-379X en |
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National University of Singapore |
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NUS Library |
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Asia |
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Singapore Singapore |
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ScholarBank@NUS |
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English |
topic |
aberration-corrected STEM, atomic-scale defects, piezoelectric, thermoelectric, polarization, interface |
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aberration-corrected STEM, atomic-scale defects, piezoelectric, thermoelectric, polarization, interface WU HAIJUN SEEING STRUCTURAL ORIGINS AND FORESEEING NEW PATHWAYS TO IMPROVED FUNCTIONAL MATERIALS WITH ABERRATION -CORRECTED SCANNING TRANSMISSION ELECTRON MICROSCOPY (STEM) |
description |
Ph.D |
author2 |
MATERIALS SCIENCE AND ENGINEERING |
author_facet |
MATERIALS SCIENCE AND ENGINEERING WU HAIJUN |
format |
Theses and Dissertations |
author |
WU HAIJUN |
author_sort |
WU HAIJUN |
title |
SEEING STRUCTURAL ORIGINS AND FORESEEING NEW PATHWAYS TO IMPROVED FUNCTIONAL MATERIALS WITH ABERRATION -CORRECTED SCANNING TRANSMISSION ELECTRON MICROSCOPY (STEM) |
title_short |
SEEING STRUCTURAL ORIGINS AND FORESEEING NEW PATHWAYS TO IMPROVED FUNCTIONAL MATERIALS WITH ABERRATION -CORRECTED SCANNING TRANSMISSION ELECTRON MICROSCOPY (STEM) |
title_full |
SEEING STRUCTURAL ORIGINS AND FORESEEING NEW PATHWAYS TO IMPROVED FUNCTIONAL MATERIALS WITH ABERRATION -CORRECTED SCANNING TRANSMISSION ELECTRON MICROSCOPY (STEM) |
title_fullStr |
SEEING STRUCTURAL ORIGINS AND FORESEEING NEW PATHWAYS TO IMPROVED FUNCTIONAL MATERIALS WITH ABERRATION -CORRECTED SCANNING TRANSMISSION ELECTRON MICROSCOPY (STEM) |
title_full_unstemmed |
SEEING STRUCTURAL ORIGINS AND FORESEEING NEW PATHWAYS TO IMPROVED FUNCTIONAL MATERIALS WITH ABERRATION -CORRECTED SCANNING TRANSMISSION ELECTRON MICROSCOPY (STEM) |
title_sort |
seeing structural origins and foreseeing new pathways to improved functional materials with aberration -corrected scanning transmission electron microscopy (stem) |
publishDate |
2021 |
url |
https://scholarbank.nus.edu.sg/handle/10635/186832 |
_version_ |
1695636016097918976 |