SEEING STRUCTURAL ORIGINS AND FORESEEING NEW PATHWAYS TO IMPROVED FUNCTIONAL MATERIALS WITH ABERRATION -CORRECTED SCANNING TRANSMISSION ELECTRON MICROSCOPY (STEM)

Ph.D

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Bibliographic Details
Main Author: WU HAIJUN
Other Authors: MATERIALS SCIENCE AND ENGINEERING
Format: Theses and Dissertations
Language:English
Published: 2021
Subjects:
Online Access:https://scholarbank.nus.edu.sg/handle/10635/186832
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Institution: National University of Singapore
Language: English
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spelling sg-nus-scholar.10635-1868322021-03-02T13:15:17Z SEEING STRUCTURAL ORIGINS AND FORESEEING NEW PATHWAYS TO IMPROVED FUNCTIONAL MATERIALS WITH ABERRATION -CORRECTED SCANNING TRANSMISSION ELECTRON MICROSCOPY (STEM) WU HAIJUN MATERIALS SCIENCE AND ENGINEERING Stephen John Pennycook aberration-corrected STEM, atomic-scale defects, piezoelectric, thermoelectric, polarization, interface Ph.D DOCTOR OF PHILOSOPHY (FOE) 2021-02-28T18:00:42Z 2021-02-28T18:00:42Z 2019-01-11 Thesis WU HAIJUN (2019-01-11). SEEING STRUCTURAL ORIGINS AND FORESEEING NEW PATHWAYS TO IMPROVED FUNCTIONAL MATERIALS WITH ABERRATION -CORRECTED SCANNING TRANSMISSION ELECTRON MICROSCOPY (STEM). ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/186832 0000-0002-7303-379X en
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
language English
topic aberration-corrected STEM, atomic-scale defects, piezoelectric, thermoelectric, polarization, interface
spellingShingle aberration-corrected STEM, atomic-scale defects, piezoelectric, thermoelectric, polarization, interface
WU HAIJUN
SEEING STRUCTURAL ORIGINS AND FORESEEING NEW PATHWAYS TO IMPROVED FUNCTIONAL MATERIALS WITH ABERRATION -CORRECTED SCANNING TRANSMISSION ELECTRON MICROSCOPY (STEM)
description Ph.D
author2 MATERIALS SCIENCE AND ENGINEERING
author_facet MATERIALS SCIENCE AND ENGINEERING
WU HAIJUN
format Theses and Dissertations
author WU HAIJUN
author_sort WU HAIJUN
title SEEING STRUCTURAL ORIGINS AND FORESEEING NEW PATHWAYS TO IMPROVED FUNCTIONAL MATERIALS WITH ABERRATION -CORRECTED SCANNING TRANSMISSION ELECTRON MICROSCOPY (STEM)
title_short SEEING STRUCTURAL ORIGINS AND FORESEEING NEW PATHWAYS TO IMPROVED FUNCTIONAL MATERIALS WITH ABERRATION -CORRECTED SCANNING TRANSMISSION ELECTRON MICROSCOPY (STEM)
title_full SEEING STRUCTURAL ORIGINS AND FORESEEING NEW PATHWAYS TO IMPROVED FUNCTIONAL MATERIALS WITH ABERRATION -CORRECTED SCANNING TRANSMISSION ELECTRON MICROSCOPY (STEM)
title_fullStr SEEING STRUCTURAL ORIGINS AND FORESEEING NEW PATHWAYS TO IMPROVED FUNCTIONAL MATERIALS WITH ABERRATION -CORRECTED SCANNING TRANSMISSION ELECTRON MICROSCOPY (STEM)
title_full_unstemmed SEEING STRUCTURAL ORIGINS AND FORESEEING NEW PATHWAYS TO IMPROVED FUNCTIONAL MATERIALS WITH ABERRATION -CORRECTED SCANNING TRANSMISSION ELECTRON MICROSCOPY (STEM)
title_sort seeing structural origins and foreseeing new pathways to improved functional materials with aberration -corrected scanning transmission electron microscopy (stem)
publishDate 2021
url https://scholarbank.nus.edu.sg/handle/10635/186832
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