Trimming-Less 0.2-V, 3.2-pW Voltage Reference Based on Corner-Aware Replica Combination with 1.6% Process Sensitivity, 1.4-mV Accuracy across PVT and Wafers

• Main Authors: Fassio, Luigi, De Rose, Raffaele, Longyang Lin, Lanuzza, Marco, Crupi, Felice, Alioto, Massimo Bruno
• Other Authors: DEPT OF ELECTRICAL & COMPUTER ENGG
• Format: Conference or Workshop Item
• Published: IEEE 2021
• Online Access: https://scholarbank.nus.edu.sg/handle/10635/192143
• Institution: National University of Singapore

IEEE ESSCIRC 2021