Toward optimal mc/dc test case generation

Toward optimal mc/dc test case generation

10.1145/3460319.3464841

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Bibliographic Details
Main Authors: Godboley, Sangharatna, Jaffar, Joxan, Maghareh, Rasool, Dutta, Arpita
Other Authors: DEPARTMENT OF COMPUTER SCIENCE
Format: Conference or Workshop Item
Published: ACM 2021
Online Access:https://scholarbank.nus.edu.sg/handle/10635/194481
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Institution: National University of Singapore
id sg-nus-scholar.10635-194481
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spelling sg-nus-scholar.10635-1944812024-04-25T06:34:23Z Toward optimal mc/dc test case generation Godboley, Sangharatna Jaffar, Joxan Maghareh, Rasool Dutta, Arpita DEPARTMENT OF COMPUTER SCIENCE 10.1145/3460319.3464841 ISSTA '21: 30th ACM SIGSOFT International Symposium on Software Testing and Analysis 2021-07-19T10:19:37Z 2021-07-19T10:19:37Z 2021-07-11 2021-07-18T14:48:57Z Conference Paper Godboley, Sangharatna, Jaffar, Joxan, Maghareh, Rasool, Dutta, Arpita (2021-07-11). Toward optimal mc/dc test case generation. ISSTA '21: 30th ACM SIGSOFT International Symposium on Software Testing and Analysis. ScholarBank@NUS Repository. https://doi.org/10.1145/3460319.3464841 9781450384599 https://scholarbank.nus.edu.sg/handle/10635/194481 ACM Elements
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description 10.1145/3460319.3464841
author2 DEPARTMENT OF COMPUTER SCIENCE
author_facet DEPARTMENT OF COMPUTER SCIENCE
Godboley, Sangharatna
Jaffar, Joxan
Maghareh, Rasool
Dutta, Arpita
format Conference or Workshop Item
author Godboley, Sangharatna
Jaffar, Joxan
Maghareh, Rasool
Dutta, Arpita
spellingShingle Godboley, Sangharatna
Jaffar, Joxan
Maghareh, Rasool
Dutta, Arpita
Toward optimal mc/dc test case generation
author_sort Godboley, Sangharatna
title Toward optimal mc/dc test case generation
title_short Toward optimal mc/dc test case generation
title_full Toward optimal mc/dc test case generation
title_fullStr Toward optimal mc/dc test case generation
title_full_unstemmed Toward optimal mc/dc test case generation
title_sort toward optimal mc/dc test case generation
publisher ACM
publishDate 2021
url https://scholarbank.nus.edu.sg/handle/10635/194481
_version_ 1800914860854214656

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