Toward optimal mc/dc test case generation

10.1145/3460319.3464841

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Bibliographic Details
Main Authors:	Godboley, Sangharatna, Jaffar, Joxan, Maghareh, Rasool, Dutta, Arpita
Other Authors:	DEPARTMENT OF COMPUTER SCIENCE
Format:	Conference or Workshop Item
Published:	ACM 2021
Online Access:	https://scholarbank.nus.edu.sg/handle/10635/194481
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Institution:	National University of Singapore

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