Variation of contact resonance frequency during domain switching in PFM measurements for ferroelectric materials
10.1016/j.jmat.2019.12.011
Saved in:
Main Authors: | Liu, Y., Sun, Y., Lu, W., Wang, H., Wang, Z., Yu, B., Li, T., Zeng, K. |
---|---|
Other Authors: | MECHANICAL ENGINEERING |
Format: | Article |
Published: |
Chinese Ceramic Society
2021
|
Subjects: | |
Online Access: | https://scholarbank.nus.edu.sg/handle/10635/198617 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | National University of Singapore |
Similar Items
-
Robust domain variants and ferroelectric property in epitaxial BiFeO3 films
by: Qiao, Xiaojun, et al.
Published: (2022) -
In situ studies of nanoscale electromechanical behavior of nacre under flexural stresses using band excitation PFM
by: Li, T., et al.
Published: (2014) -
Fabrication and Characterization of Chemically Modified Multiferroic Bismuth Ferrite Thin Films
by: YAN FENG
Published: (2012) -
DATA-DRIVEN ANALYSIS ON THE CONTACT RESONANCE FREQUENCY IN THE STRAIN-BASED SPM
by: LIU YUE
Published: (2023) -
Ferroelastic domain wall dynamics in ferroelectric bilayers
by: Anbusathaiah, V., et al.
Published: (2014)