STUDY OF NANOSCALE BIAS-INDUCED PHYSICAL PHENOMENA OF FUNCTIONAL OXIDE MATERIALS USING SCANNING PROBE MICROSCOPY

Ph.D

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Bibliographic Details
Main Author:	YU BINGXUE
Other Authors:	MECHANICAL ENGINEERING
Format:	Theses and Dissertations
Language:	English
Published:	2021
Subjects:	scanning probe microscopy, metal oxide, memristive switching, oxygen vacancy, hafnium oxide，vanadium dioxide
Online Access:	https://scholarbank.nus.edu.sg/handle/10635/208353
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Institution:	National University of Singapore
Language:	English

id	sg-nus-scholar.10635-208353
record_format	dspace
spelling	sg-nus-scholar.10635-2083532023-12-01T18:01:17Z STUDY OF NANOSCALE BIAS-INDUCED PHYSICAL PHENOMENA OF FUNCTIONAL OXIDE MATERIALS USING SCANNING PROBE MICROSCOPY YU BINGXUE MECHANICAL ENGINEERING Kaiyang Zeng Yuan Ping Feng scanning probe microscopy, metal oxide, memristive switching, oxygen vacancy, hafnium oxide，vanadium dioxide Ph.D DOCTOR OF PHILOSOPHY (CDE-ENG) 2021-11-26T18:00:27Z 2021-11-26T18:00:27Z 2021-07-28 Thesis YU BINGXUE (2021-07-28). STUDY OF NANOSCALE BIAS-INDUCED PHYSICAL PHENOMENA OF FUNCTIONAL OXIDE MATERIALS USING SCANNING PROBE MICROSCOPY. ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/208353 0000-0002-2256-0194 en
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
language	English
topic	scanning probe microscopy, metal oxide, memristive switching, oxygen vacancy, hafnium oxide，vanadium dioxide
spellingShingle	scanning probe microscopy, metal oxide, memristive switching, oxygen vacancy, hafnium oxide，vanadium dioxide YU BINGXUE STUDY OF NANOSCALE BIAS-INDUCED PHYSICAL PHENOMENA OF FUNCTIONAL OXIDE MATERIALS USING SCANNING PROBE MICROSCOPY
description	Ph.D
author2	MECHANICAL ENGINEERING
author_facet	MECHANICAL ENGINEERING YU BINGXUE
format	Theses and Dissertations
author	YU BINGXUE
author_sort	YU BINGXUE
title	STUDY OF NANOSCALE BIAS-INDUCED PHYSICAL PHENOMENA OF FUNCTIONAL OXIDE MATERIALS USING SCANNING PROBE MICROSCOPY
title_short	STUDY OF NANOSCALE BIAS-INDUCED PHYSICAL PHENOMENA OF FUNCTIONAL OXIDE MATERIALS USING SCANNING PROBE MICROSCOPY
title_full	STUDY OF NANOSCALE BIAS-INDUCED PHYSICAL PHENOMENA OF FUNCTIONAL OXIDE MATERIALS USING SCANNING PROBE MICROSCOPY
title_fullStr	STUDY OF NANOSCALE BIAS-INDUCED PHYSICAL PHENOMENA OF FUNCTIONAL OXIDE MATERIALS USING SCANNING PROBE MICROSCOPY
title_full_unstemmed	STUDY OF NANOSCALE BIAS-INDUCED PHYSICAL PHENOMENA OF FUNCTIONAL OXIDE MATERIALS USING SCANNING PROBE MICROSCOPY
title_sort	study of nanoscale bias-induced physical phenomena of functional oxide materials using scanning probe microscopy
publishDate	2021
url	https://scholarbank.nus.edu.sg/handle/10635/208353
_version_	1784855491108667392

STUDY OF NANOSCALE BIAS-INDUCED PHYSICAL PHENOMENA OF FUNCTIONAL OXIDE MATERIALS USING SCANNING PROBE MICROSCOPY

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