Correlation of resistance switching and polarization rotation in copper doped zinc oxide (ZnO:Cu) thin films studied by Scanning Probe Microscopy

10.1016/j.jmat.2019.09.001

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Main Authors: Xiao, J., Herng, T.S., Guo, Y., Ding, J., Wang, N., Zeng, K.
Other Authors: MATERIALS SCIENCE AND ENGINEERING
Format: Article
Published: Chinese Ceramic Society 2021
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Online Access:https://scholarbank.nus.edu.sg/handle/10635/210683
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-2106832024-04-17T02:42:51Z Correlation of resistance switching and polarization rotation in copper doped zinc oxide (ZnO:Cu) thin films studied by Scanning Probe Microscopy Xiao, J. Herng, T.S. Guo, Y. Ding, J. Wang, N. Zeng, K. MATERIALS SCIENCE AND ENGINEERING MECHANICAL ENGINEERING Built-in voltage Next generation memory Polarization rotation Resistive switching ZnO:Cu thin film 10.1016/j.jmat.2019.09.001 Journal of Materiomics 5 4 574-582 2021-12-16T07:43:49Z 2021-12-16T07:43:49Z 2019 Article Xiao, J., Herng, T.S., Guo, Y., Ding, J., Wang, N., Zeng, K. (2019). Correlation of resistance switching and polarization rotation in copper doped zinc oxide (ZnO:Cu) thin films studied by Scanning Probe Microscopy. Journal of Materiomics 5 (4) : 574-582. ScholarBank@NUS Repository. https://doi.org/10.1016/j.jmat.2019.09.001 23528478 https://scholarbank.nus.edu.sg/handle/10635/210683 Attribution-NonCommercial-NoDerivatives 4.0 International https://creativecommons.org/licenses/by-nc-nd/4.0/ Chinese Ceramic Society Scopus OA2019
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
topic Built-in voltage
Next generation memory
Polarization rotation
Resistive switching
ZnO:Cu thin film
spellingShingle Built-in voltage
Next generation memory
Polarization rotation
Resistive switching
ZnO:Cu thin film
Xiao, J.
Herng, T.S.
Guo, Y.
Ding, J.
Wang, N.
Zeng, K.
Correlation of resistance switching and polarization rotation in copper doped zinc oxide (ZnO:Cu) thin films studied by Scanning Probe Microscopy
description 10.1016/j.jmat.2019.09.001
author2 MATERIALS SCIENCE AND ENGINEERING
author_facet MATERIALS SCIENCE AND ENGINEERING
Xiao, J.
Herng, T.S.
Guo, Y.
Ding, J.
Wang, N.
Zeng, K.
format Article
author Xiao, J.
Herng, T.S.
Guo, Y.
Ding, J.
Wang, N.
Zeng, K.
author_sort Xiao, J.
title Correlation of resistance switching and polarization rotation in copper doped zinc oxide (ZnO:Cu) thin films studied by Scanning Probe Microscopy
title_short Correlation of resistance switching and polarization rotation in copper doped zinc oxide (ZnO:Cu) thin films studied by Scanning Probe Microscopy
title_full Correlation of resistance switching and polarization rotation in copper doped zinc oxide (ZnO:Cu) thin films studied by Scanning Probe Microscopy
title_fullStr Correlation of resistance switching and polarization rotation in copper doped zinc oxide (ZnO:Cu) thin films studied by Scanning Probe Microscopy
title_full_unstemmed Correlation of resistance switching and polarization rotation in copper doped zinc oxide (ZnO:Cu) thin films studied by Scanning Probe Microscopy
title_sort correlation of resistance switching and polarization rotation in copper doped zinc oxide (zno:cu) thin films studied by scanning probe microscopy
publisher Chinese Ceramic Society
publishDate 2021
url https://scholarbank.nus.edu.sg/handle/10635/210683
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