Correlation of resistance switching and polarization rotation in copper doped zinc oxide (ZnO:Cu) thin films studied by Scanning Probe Microscopy

10.1016/j.jmat.2019.09.001

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Bibliographic Details
Main Authors:	Xiao, J., Herng, T.S., Guo, Y., Ding, J., Wang, N., Zeng, K.
Other Authors:	MATERIALS SCIENCE AND ENGINEERING
Format:	Article
Published:	Chinese Ceramic Society 2021
Subjects:	Built-in voltage Next generation memory Polarization rotation Resistive switching ZnO:Cu thin film
Online Access:	https://scholarbank.nus.edu.sg/handle/10635/210683
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Institution:	National University of Singapore

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