Charge Carrier Mobility and Series Resistance Extraction in 2D Field-Effect Transistors: Toward the Universal Technique

Charge Carrier Mobility and Series Resistance Extraction in 2D Field-Effect Transistors: Toward the Universal Technique

https://doi.org/10.1002/adfm.202105003

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Bibliographic Details
Main Authors: Yu-Chieh Chien, Xuewei Feng, Li Chen, Kai-Chun Chang, Wee Chong Tan, Sifan Li, Li Huang, Kah Wee Ang
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2023
Subjects:
2D semiconductor field-effect transistors
charge carrier mobility
contact resistance
parameters extraction
Online Access:https://scholarbank.nus.edu.sg/handle/10635/238664
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Institution: National University of Singapore
Description
Summary:https://doi.org/10.1002/adfm.202105003

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