Charge Carrier Mobility and Series Resistance Extraction in 2D Field-Effect Transistors: Toward the Universal Technique
https://doi.org/10.1002/adfm.202105003
Saved in:
| Main Authors: | , , , , , , , |
|---|---|
| Other Authors: | |
| Format: | Article |
| Published: |
2023
|
| Subjects: | |
| Online Access: | https://scholarbank.nus.edu.sg/handle/10635/238664 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Institution: | National University of Singapore |
| id |
sg-nus-scholar.10635-238664 |
|---|---|
| record_format |
dspace |
| spelling |
sg-nus-scholar.10635-2386642024-11-15T09:03:07Z Charge Carrier Mobility and Series Resistance Extraction in 2D Field-Effect Transistors: Toward the Universal Technique Yu-Chieh Chien Xuewei Feng Li Chen Kai-Chun Chang Wee Chong Tan Sifan Li Li Huang Kah Wee Ang ELECTRICAL & COMPUTER ENGINEERING 2D semiconductor field-effect transistors charge carrier mobility contact resistance parameters extraction https://doi.org/10.1002/adfm.202105003 Advanced Functional Materials 31 41 2023-04-04T02:27:49Z 2023-04-04T02:27:49Z 2021-07-16 Article Yu-Chieh Chien, Xuewei Feng, Li Chen, Kai-Chun Chang, Wee Chong Tan, Sifan Li, Li Huang, Kah Wee Ang (2021-07-16). Charge Carrier Mobility and Series Resistance Extraction in 2D Field-Effect Transistors: Toward the Universal Technique. Advanced Functional Materials 31 (41). ScholarBank@NUS Repository. https://doi.org/https://doi.org/10.1002/adfm.202105003 1616-3028 1616-301X https://scholarbank.nus.edu.sg/handle/10635/238664 CC0 1.0 Universal http://creativecommons.org/publicdomain/zero/1.0/ |
| institution |
National University of Singapore |
| building |
NUS Library |
| continent |
Asia |
| country |
Singapore Singapore |
| content_provider |
NUS Library |
| collection |
ScholarBank@NUS |
| topic |
2D semiconductor field-effect transistors charge carrier mobility contact resistance parameters extraction |
| spellingShingle |
2D semiconductor field-effect transistors charge carrier mobility contact resistance parameters extraction Yu-Chieh Chien Xuewei Feng Li Chen Kai-Chun Chang Wee Chong Tan Sifan Li Li Huang Kah Wee Ang Charge Carrier Mobility and Series Resistance Extraction in 2D Field-Effect Transistors: Toward the Universal Technique |
| description |
https://doi.org/10.1002/adfm.202105003 |
| author2 |
ELECTRICAL & COMPUTER ENGINEERING |
| author_facet |
ELECTRICAL & COMPUTER ENGINEERING Yu-Chieh Chien Xuewei Feng Li Chen Kai-Chun Chang Wee Chong Tan Sifan Li Li Huang Kah Wee Ang |
| format |
Article |
| author |
Yu-Chieh Chien Xuewei Feng Li Chen Kai-Chun Chang Wee Chong Tan Sifan Li Li Huang Kah Wee Ang |
| author_sort |
Yu-Chieh Chien |
| title |
Charge Carrier Mobility and Series Resistance Extraction in 2D Field-Effect Transistors: Toward the Universal Technique |
| title_short |
Charge Carrier Mobility and Series Resistance Extraction in 2D Field-Effect Transistors: Toward the Universal Technique |
| title_full |
Charge Carrier Mobility and Series Resistance Extraction in 2D Field-Effect Transistors: Toward the Universal Technique |
| title_fullStr |
Charge Carrier Mobility and Series Resistance Extraction in 2D Field-Effect Transistors: Toward the Universal Technique |
| title_full_unstemmed |
Charge Carrier Mobility and Series Resistance Extraction in 2D Field-Effect Transistors: Toward the Universal Technique |
| title_sort |
charge carrier mobility and series resistance extraction in 2d field-effect transistors: toward the universal technique |
| publishDate |
2023 |
| url |
https://scholarbank.nus.edu.sg/handle/10635/238664 |
| _version_ |
1821183539342737408 |