A Novel Time Domain Model for Permittivity and Thickness Measurement
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2023
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sg-nus-scholar.10635-2446282023-08-28T09:02:21Z A Novel Time Domain Model for Permittivity and Thickness Measurement Xianzhong Tian Tianying Chang Yongxin Guo Hong-Liang Cui DEPT OF ELECTRICAL & COMPUTER ENGG 2023-08-28T08:50:18Z 2023-08-28T08:50:18Z 2023-04-18 Article Xianzhong Tian, Tianying Chang, Yongxin Guo, Hong-Liang Cui (2023-04-18). A Novel Time Domain Model for Permittivity and Thickness Measurement. ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/244628 Attribution-NonCommercial-NoDerivatives 4.0 International http://creativecommons.org/licenses/by-nc-nd/4.0/ |
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DEPT OF ELECTRICAL & COMPUTER ENGG |
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DEPT OF ELECTRICAL & COMPUTER ENGG Xianzhong Tian Tianying Chang Yongxin Guo Hong-Liang Cui |
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Article |
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Xianzhong Tian Tianying Chang Yongxin Guo Hong-Liang Cui |
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Xianzhong Tian Tianying Chang Yongxin Guo Hong-Liang Cui A Novel Time Domain Model for Permittivity and Thickness Measurement |
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Xianzhong Tian |
title |
A Novel Time Domain Model for Permittivity and Thickness Measurement |
title_short |
A Novel Time Domain Model for Permittivity and Thickness Measurement |
title_full |
A Novel Time Domain Model for Permittivity and Thickness Measurement |
title_fullStr |
A Novel Time Domain Model for Permittivity and Thickness Measurement |
title_full_unstemmed |
A Novel Time Domain Model for Permittivity and Thickness Measurement |
title_sort |
novel time domain model for permittivity and thickness measurement |
publishDate |
2023 |
url |
https://scholarbank.nus.edu.sg/handle/10635/244628 |
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