A Novel Time Domain Model for Permittivity and Thickness Measurement

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Bibliographic Details
Main Authors: Xianzhong Tian, Tianying Chang, Yongxin Guo, Hong-Liang Cui
Other Authors: DEPT OF ELECTRICAL & COMPUTER ENGG
Format: Article
Published: 2023
Online Access:https://scholarbank.nus.edu.sg/handle/10635/244628
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Institution: National University of Singapore
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