A Novel Time Domain Model for Permittivity and Thickness Measurement

10.1109/TGRS.2023.3268120

Saved in:

Bibliographic Details
Main Authors:	Xianzhong Tian, Tianying Chang, Yongxin Guo, Hong-Liang Cui
Other Authors:	ELECTRICAL AND COMPUTER ENGINEERING
Format:	Article
Language:	English
Published:	IEEE 2023
Subjects:	Bistatic radar, delay measurement, incident angle, permittivity, thickness
Online Access:	https://scholarbank.nus.edu.sg/handle/10635/245146
Tags:	Add Tag No Tags, Be the first to tag this record!
Institution:	National University of Singapore
Language:	English

Description
Summary:	10.1109/TGRS.2023.3268120

Similar Items