A Novel Time Domain Model for Permittivity and Thickness Measurement

10.1109/TGRS.2023.3268120

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Bibliographic Details
Main Authors:	Xianzhong Tian, Tianying Chang, Yongxin Guo, Hong-Liang Cui
Other Authors:	ELECTRICAL AND COMPUTER ENGINEERING
Format:	Article
Language:	English
Published:	IEEE 2023
Subjects:	Bistatic radar, delay measurement, incident angle, permittivity, thickness
Online Access:	https://scholarbank.nus.edu.sg/handle/10635/245146
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Institution:	National University of Singapore
Language:	English

id	sg-nus-scholar.10635-245146
record_format	dspace
spelling	sg-nus-scholar.10635-2451462024-04-16T10:50:11Z A Novel Time Domain Model for Permittivity and Thickness Measurement Xianzhong Tian Tianying Chang Yongxin Guo Hong-Liang Cui ELECTRICAL AND COMPUTER ENGINEERING Bistatic radar, delay measurement, incident angle, permittivity, thickness 10.1109/TGRS.2023.3268120 IEEE Transactions on Geoscience and Remote Sensing 61 2023-10-05T02:31:36Z 2023-10-05T02:31:36Z 2023-04-18 Article Xianzhong Tian, Tianying Chang, Yongxin Guo, Hong-Liang Cui (2023-04-18). A Novel Time Domain Model for Permittivity and Thickness Measurement. IEEE Transactions on Geoscience and Remote Sensing 61. ScholarBank@NUS Repository. https://doi.org/10.1109/TGRS.2023.3268120 0196-2892 https://scholarbank.nus.edu.sg/handle/10635/245146 en CC0 1.0 Universal http://creativecommons.org/publicdomain/zero/1.0/ IEEE
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
language	English
topic	Bistatic radar, delay measurement, incident angle, permittivity, thickness
spellingShingle	Bistatic radar, delay measurement, incident angle, permittivity, thickness Xianzhong Tian Tianying Chang Yongxin Guo Hong-Liang Cui A Novel Time Domain Model for Permittivity and Thickness Measurement
description	10.1109/TGRS.2023.3268120
author2	ELECTRICAL AND COMPUTER ENGINEERING
author_facet	ELECTRICAL AND COMPUTER ENGINEERING Xianzhong Tian Tianying Chang Yongxin Guo Hong-Liang Cui
format	Article
author	Xianzhong Tian Tianying Chang Yongxin Guo Hong-Liang Cui
author_sort	Xianzhong Tian
title	A Novel Time Domain Model for Permittivity and Thickness Measurement
title_short	A Novel Time Domain Model for Permittivity and Thickness Measurement
title_full	A Novel Time Domain Model for Permittivity and Thickness Measurement
title_fullStr	A Novel Time Domain Model for Permittivity and Thickness Measurement
title_full_unstemmed	A Novel Time Domain Model for Permittivity and Thickness Measurement
title_sort	novel time domain model for permittivity and thickness measurement
publisher	IEEE
publishDate	2023
url	https://scholarbank.nus.edu.sg/handle/10635/245146
_version_	1800915947653955584

A Novel Time Domain Model for Permittivity and Thickness Measurement

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