Attack Resilient True Random Number Generators Using Ferroelectric-Enhanced Stochasticity in 2D Transistor

10.1002/smll.202302842

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Bibliographic Details
Main Authors: Chien, Yu-Chieh, Xiang, Heng, Wang, Jianze, Shi, Yufei, Fong, Xuanyao, Ang, Kah-Wee
Other Authors: ELECTRICAL AND COMPUTER ENGINEERING
Format: Article
Language:English
Published: WILEY-V C H VERLAG GMBH 2023
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Online Access:https://scholarbank.nus.edu.sg/handle/10635/245740
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Institution: National University of Singapore
Language: English