Attack Resilient True Random Number Generators Using Ferroelectric-Enhanced Stochasticity in 2D Transistor

Attack Resilient True Random Number Generators Using Ferroelectric-Enhanced Stochasticity in 2D Transistor

10.1002/smll.202302842

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Bibliographic Details
Main Authors:	Chien, Yu-Chieh, Xiang, Heng, Wang, Jianze, Shi, Yufei, Fong, Xuanyao, Ang, Kah-Wee
Other Authors:	ELECTRICAL AND COMPUTER ENGINEERING
Format:	Article
Language:	English
Published:	WILEY-V C H VERLAG GMBH 2023
Subjects:	Science & Technology Physical Sciences Technology Chemistry, Multidisciplinary Chemistry, Physical Nanoscience & Nanotechnology Materials Science, Multidisciplinary Physics, Applied Physics, Condensed Matter Chemistry Science & Technology - Other Topics Materials Science Physics ferroelectric true random number generators 2D transistors SHORT-TERM-MEMORY
Online Access:	https://scholarbank.nus.edu.sg/handle/10635/245740
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Institution:	National University of Singapore
Language:	English

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