SINGLE IMPURITY TUNNELING CURRENT AND PHOTOCURRENT MEASUREMENT IN 2D MATERIAL BY CONDUCTIVE ATOMIC FORCE MICROSCOPY

Ph.D

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Bibliographic Details
Main Author:	VU THANH TRUNG NAM
Other Authors:	PHYSICS
Format:	Theses and Dissertations
Language:	English
Published:	2023
Subjects:	2D semiconductor, transition metal dichalcogenides, impurity doping, atomic force microscopy, resonant tunneling, photocurrent
Online Access:	https://scholarbank.nus.edu.sg/handle/10635/246475
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Institution:	National University of Singapore
Language:	English

id	sg-nus-scholar.10635-246475
record_format	dspace
spelling	sg-nus-scholar.10635-2464752023-12-18T18:00:20Z SINGLE IMPURITY TUNNELING CURRENT AND PHOTOCURRENT MEASUREMENT IN 2D MATERIAL BY CONDUCTIVE ATOMIC FORCE MICROSCOPY VU THANH TRUNG NAM PHYSICS Goki Eda 2D semiconductor, transition metal dichalcogenides, impurity doping, atomic force microscopy, resonant tunneling, photocurrent Ph.D DOCTOR OF PHILOSOPHY (FOS) 2023-12-18T18:00:20Z 2023-12-18T18:00:20Z 2023-08-27 Thesis VU THANH TRUNG NAM (2023-08-27). SINGLE IMPURITY TUNNELING CURRENT AND PHOTOCURRENT MEASUREMENT IN 2D MATERIAL BY CONDUCTIVE ATOMIC FORCE MICROSCOPY. ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/246475 0009-0002-7814-1180 en
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
language	English
topic	2D semiconductor, transition metal dichalcogenides, impurity doping, atomic force microscopy, resonant tunneling, photocurrent
spellingShingle	2D semiconductor, transition metal dichalcogenides, impurity doping, atomic force microscopy, resonant tunneling, photocurrent VU THANH TRUNG NAM SINGLE IMPURITY TUNNELING CURRENT AND PHOTOCURRENT MEASUREMENT IN 2D MATERIAL BY CONDUCTIVE ATOMIC FORCE MICROSCOPY
description	Ph.D
author2	PHYSICS
author_facet	PHYSICS VU THANH TRUNG NAM
format	Theses and Dissertations
author	VU THANH TRUNG NAM
author_sort	VU THANH TRUNG NAM
title	SINGLE IMPURITY TUNNELING CURRENT AND PHOTOCURRENT MEASUREMENT IN 2D MATERIAL BY CONDUCTIVE ATOMIC FORCE MICROSCOPY
title_short	SINGLE IMPURITY TUNNELING CURRENT AND PHOTOCURRENT MEASUREMENT IN 2D MATERIAL BY CONDUCTIVE ATOMIC FORCE MICROSCOPY
title_full	SINGLE IMPURITY TUNNELING CURRENT AND PHOTOCURRENT MEASUREMENT IN 2D MATERIAL BY CONDUCTIVE ATOMIC FORCE MICROSCOPY
title_fullStr	SINGLE IMPURITY TUNNELING CURRENT AND PHOTOCURRENT MEASUREMENT IN 2D MATERIAL BY CONDUCTIVE ATOMIC FORCE MICROSCOPY
title_full_unstemmed	SINGLE IMPURITY TUNNELING CURRENT AND PHOTOCURRENT MEASUREMENT IN 2D MATERIAL BY CONDUCTIVE ATOMIC FORCE MICROSCOPY
title_sort	single impurity tunneling current and photocurrent measurement in 2d material by conductive atomic force microscopy
publishDate	2023
url	https://scholarbank.nus.edu.sg/handle/10635/246475
_version_	1787136362569269248

SINGLE IMPURITY TUNNELING CURRENT AND PHOTOCURRENT MEASUREMENT IN 2D MATERIAL BY CONDUCTIVE ATOMIC FORCE MICROSCOPY

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