SINGLE IMPURITY TUNNELING CURRENT AND PHOTOCURRENT MEASUREMENT IN 2D MATERIAL BY CONDUCTIVE ATOMIC FORCE MICROSCOPY

Ph.D

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Bibliographic Details
Main Author: VU THANH TRUNG NAM
Other Authors: PHYSICS
Format: Theses and Dissertations
Language:English
Published: 2023
Subjects:
Online Access:https://scholarbank.nus.edu.sg/handle/10635/246475
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Institution: National University of Singapore
Language: English
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