Direct Observation of Semimetal Contact Induced Charge Doping and Strain Effect in CVD‐Grown Monolayer MoS2 Transistors

Direct Observation of Semimetal Contact Induced Charge Doping and Strain Effect in CVD‐Grown Monolayer MoS2 Transistors

10.1002/aelm.202300820

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Bibliographic Details
Main Authors: Xuewei Feng, Zhi Gen Yu, Haoyue Guo, Yida Li, Yong-Wei Zhang, Kah Wee Ang
Other Authors: ELECTRICAL AND COMPUTER ENGINEERING
Format: Article
Language:English
Published: 2024
Online Access:https://scholarbank.nus.edu.sg/handle/10635/248327
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Institution: National University of Singapore
Language: English

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https://scholarbank.nus.edu.sg/handle/10635/248327

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