Direct Observation of Semimetal Contact Induced Charge Doping and Strain Effect in CVD‐Grown Monolayer MoS2 Transistors

10.1002/aelm.202300820

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Bibliographic Details
Main Authors: Xuewei Feng, Zhi Gen Yu, Haoyue Guo, Yida Li, Yong-Wei Zhang, Kah Wee Ang
Other Authors: ELECTRICAL AND COMPUTER ENGINEERING
Format: Article
Language:English
Published: 2024
Online Access:https://scholarbank.nus.edu.sg/handle/10635/248327
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Institution: National University of Singapore
Language: English

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