Automatic EEG artifact removal: A weighted support vector machine approach with error correction

• Main Authors: Shao, S.-Y., Shen, K.-Q., Ong, C.J., Wilder-Smith, E.P.V., Li, X.-P.
• Other Authors: MECHANICAL ENGINEERING
• Format: Article
• Published: 2011
• Subjects: Artifact removal; Electroencephalogram; Error correction; Weighted support vector machine (SVM)
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/27049
• Institution: National University of Singapore

10.1109/TBME.2008.2005969