A Hilbert-Curve Based Delay Fault Characerization Framework for Fpgas

• Main Author: ZHANG WENJUAN
• Other Authors: ELECTRICAL & COMPUTER ENGINEERING
• Format: Theses and Dissertations
• Language: English
• Published: 2012
• Subjects: FPGA, Delay Fault, Delay Fault Characterization, Space-Filling Curves, Hilbert Curve, Timing Yield
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/30724
• Institution: National University of Singapore

Master's