Electron microscope and a method of imaging objects

US7326928

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Bibliographic Details
Main Author: KHURSHEED, ANJAM
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Patent
Published: 2012
Online Access:http://scholarbank.nus.edu.sg/handle/10635/32755
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Institution: National University of Singapore
id sg-nus-scholar.10635-32755
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spelling sg-nus-scholar.10635-327552015-07-29T07:03:58Z Electron microscope and a method of imaging objects KHURSHEED, ANJAM ELECTRICAL & COMPUTER ENGINEERING NATIONAL UNIVERSITY OF SINGAPORE US7326928 Granted Patent 2012-05-02T02:29:55Z 2012-05-02T02:29:55Z 2008-02-05 Patent KHURSHEED, ANJAM (2008-02-05). Electron microscope and a method of imaging objects. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/32755 NOT_IN_WOS PatSnap
institution National University of Singapore
building NUS Library
country Singapore
collection ScholarBank@NUS
description US7326928
author2 ELECTRICAL & COMPUTER ENGINEERING
author_facet ELECTRICAL & COMPUTER ENGINEERING
KHURSHEED, ANJAM
format Patent
author KHURSHEED, ANJAM
spellingShingle KHURSHEED, ANJAM
Electron microscope and a method of imaging objects
author_sort KHURSHEED, ANJAM
title Electron microscope and a method of imaging objects
title_short Electron microscope and a method of imaging objects
title_full Electron microscope and a method of imaging objects
title_fullStr Electron microscope and a method of imaging objects
title_full_unstemmed Electron microscope and a method of imaging objects
title_sort electron microscope and a method of imaging objects
publishDate 2012
url http://scholarbank.nus.edu.sg/handle/10635/32755
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