Electron microscope and a method of imaging objects
US7326928
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2012
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/32755 |
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sg-nus-scholar.10635-327552015-07-29T07:03:58Z Electron microscope and a method of imaging objects KHURSHEED, ANJAM ELECTRICAL & COMPUTER ENGINEERING NATIONAL UNIVERSITY OF SINGAPORE US7326928 Granted Patent 2012-05-02T02:29:55Z 2012-05-02T02:29:55Z 2008-02-05 Patent KHURSHEED, ANJAM (2008-02-05). Electron microscope and a method of imaging objects. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/32755 NOT_IN_WOS PatSnap |
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US7326928 |
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ELECTRICAL & COMPUTER ENGINEERING |
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ELECTRICAL & COMPUTER ENGINEERING KHURSHEED, ANJAM |
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Patent |
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KHURSHEED, ANJAM |
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KHURSHEED, ANJAM Electron microscope and a method of imaging objects |
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KHURSHEED, ANJAM |
title |
Electron microscope and a method of imaging objects |
title_short |
Electron microscope and a method of imaging objects |
title_full |
Electron microscope and a method of imaging objects |
title_fullStr |
Electron microscope and a method of imaging objects |
title_full_unstemmed |
Electron microscope and a method of imaging objects |
title_sort |
electron microscope and a method of imaging objects |
publishDate |
2012 |
url |
http://scholarbank.nus.edu.sg/handle/10635/32755 |
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1681081280943357952 |