Electron microscope and a method of imaging objects
US7326928
Saved in:
Main Author: | KHURSHEED, ANJAM |
---|---|
Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Patent |
Published: |
2012
|
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/32755 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | National University of Singapore |
Similar Items
-
Electron microscope and a method of imaging objects
by: KHURSHEED, ANJAM
Published: (2012) -
Scanning electron microscope
by: KHURSHEED, ANJAM
Published: (2012) -
Lens for a scanning electron microscope
by: KHURSHEED, ANJAM
Published: (2012) -
Secondary Electron Energy Spectroscopy In The Scanning Electron Microscope
by: Khursheed, Anjam
Published: (2021) -
Multi-beam ion/electron spectra-microscope
by: KHURSHEED ANJAM
Published: (2012)