Second-order aberration corrected electron energy loss spectroscopy attachment for scanning electron microscopes
10.1063/1.2190208
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| Main Authors: | , |
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| 格式: | Article |
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2014
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| 在線閱讀: | http://scholarbank.nus.edu.sg/handle/10635/57344 |
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| 機構: | National University of Singapore |