Experimental results from a second-order focusing toroidal energy spectrometer attachment for scanning electron microscopes

10.1016/j.nima.2010.12.010

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Bibliographic Details
Main Authors: Hoang, H.Q., Osterberg, M., Khursheed, A.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/70251
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Institution: National University of Singapore