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Osterberg, M.
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Osterberg, M.
Showing
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Osterberg, M.
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1
A spectroscopic scanning electron microscope design
by
Khursheed, A.
,
Osterberg
,
M
.
Published 2014
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2
A spectroscopic SEM: First results
by
Osterberg
,
M
.
,
Khursheed, A.
Published 2014
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3
Simulation of magnetic sector deflector aberration properties for low-energy electron microscopy
by
Osterberg
,
M
.
,
Khursheed, A.
Published 2014
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4
Developments in the design of a spectroscopic scanning electron microscope
by
Khursheed, A.
,
Osterberg
,
M
.
Published 2014
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5
A high signal-to-noise ratio toroidal electron spectrometer for the SEM
by
Hoang, H.Q.
,
Osterberg
,
M
.
,
Khursheed, A.
Published 2014
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6
Experimental results from a second-order focusing toroidal energy spectrometer attachment for scanning electron microscopes
by
Hoang, H.Q.
,
Osterberg
,
M
.
,
Khursheed, A.
Published 2014
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7
Design of a multiple-electron-beam imaging technique for surface inspection
by
Luo, T.
,
Khursheed, A.
,
Osterberg
,
M
.
,
Hoang, H.
Published 2014
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8
Initial experimental results on a magnetic beam separator spectrometer for the SEM
by
Osterberg
,
M
.
,
Hoang, H.Q.
,
Khursheed, A.
Published 2014
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9
Add-on transmission attachments for the scanning electron microscope
by
Khursheed, A.
,
Karuppiah, N.
,
Osterberg
,
M
.
,
Thong, J.T.L.
Published 2014
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10
Improvements to the design of an electrostatic toroidal backscattered electron spectrometer for the scanning electron microscope
by
Rau, E.I.
,
Khursheed, A.
,
Gostev, A.V.
,
Osterberg
,
M
.
Published 2014
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