Improvements to the design of an electrostatic toroidal backscattered electron spectrometer for the scanning electron microscope

by Rau, E.I., Khursheed, A., Gostev, A.V., Osterberg, M.
Published 2014

Comparative Analysis of Scanning Electron Microscopy Techniques for Semiconductors: Electron-Beam-Induced Potential Method, Single-Contact Electron-Beam-Induced Current Method, and...

by Rau, E.I., Gostev, A.V., Shiqiu, Z., Phang, D., Chan, D., Thong, D., Wong, W.
Published 2014

Microtomography and improved resolution in cathodoluminescence microscopy using confocal mirror optics

by Chan, D.S.H., Liu, Y.Y., Phang, J.C.H., Rau, E., Sennov, R., Gostev, A.V.
Published 2014