Experimental results from a second-order focusing toroidal energy spectrometer attachment for scanning electron microscopes

10.1016/j.nima.2010.12.010

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Bibliographic Details
Main Authors:	Hoang, H.Q., Osterberg, M., Khursheed, A.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Conference or Workshop Item
Published:	2014
Subjects:	Energy electron spectrometer Scanning electron microscopy Toroidal spectrometer
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/70251
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Institution:	National University of Singapore

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spelling	sg-nus-scholar.10635-702512023-10-25T20:13:23Z Experimental results from a second-order focusing toroidal energy spectrometer attachment for scanning electron microscopes Hoang, H.Q. Osterberg, M. Khursheed, A. ELECTRICAL & COMPUTER ENGINEERING Energy electron spectrometer Scanning electron microscopy Toroidal spectrometer 10.1016/j.nima.2010.12.010 Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 645 1 241-244 NIMAE 2014-06-19T03:09:59Z 2014-06-19T03:09:59Z 2011-07-21 Conference Paper Hoang, H.Q., Osterberg, M., Khursheed, A. (2011-07-21). Experimental results from a second-order focusing toroidal energy spectrometer attachment for scanning electron microscopes. Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 645 (1) : 241-244. ScholarBank@NUS Repository. https://doi.org/10.1016/j.nima.2010.12.010 01689002 http://scholarbank.nus.edu.sg/handle/10635/70251 000292713900045 Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
topic	Energy electron spectrometer Scanning electron microscopy Toroidal spectrometer
spellingShingle	Energy electron spectrometer Scanning electron microscopy Toroidal spectrometer Hoang, H.Q. Osterberg, M. Khursheed, A. Experimental results from a second-order focusing toroidal energy spectrometer attachment for scanning electron microscopes
description	10.1016/j.nima.2010.12.010
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING Hoang, H.Q. Osterberg, M. Khursheed, A.
format	Conference or Workshop Item
author	Hoang, H.Q. Osterberg, M. Khursheed, A.
author_sort	Hoang, H.Q.
title	Experimental results from a second-order focusing toroidal energy spectrometer attachment for scanning electron microscopes
title_short	Experimental results from a second-order focusing toroidal energy spectrometer attachment for scanning electron microscopes
title_full	Experimental results from a second-order focusing toroidal energy spectrometer attachment for scanning electron microscopes
title_fullStr	Experimental results from a second-order focusing toroidal energy spectrometer attachment for scanning electron microscopes
title_full_unstemmed	Experimental results from a second-order focusing toroidal energy spectrometer attachment for scanning electron microscopes
title_sort	experimental results from a second-order focusing toroidal energy spectrometer attachment for scanning electron microscopes
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/70251
_version_	1781783146785669120

Experimental results from a second-order focusing toroidal energy spectrometer attachment for scanning electron microscopes

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