Second-order aberration corrected electron energy loss spectroscopy attachment for scanning electron microscopes

10.1063/1.2190208

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Bibliographic Details
Main Authors:	Luo, T., Khursheed, A.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/57344
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-57344
record_format	dspace
spelling	sg-nus-scholar.10635-573442023-10-30T10:26:40Z Second-order aberration corrected electron energy loss spectroscopy attachment for scanning electron microscopes Luo, T. Khursheed, A. ELECTRICAL & COMPUTER ENGINEERING 10.1063/1.2190208 Review of Scientific Instruments 77 4 - RSINA 2014-06-17T03:05:06Z 2014-06-17T03:05:06Z 2006 Article Luo, T., Khursheed, A. (2006). Second-order aberration corrected electron energy loss spectroscopy attachment for scanning electron microscopes. Review of Scientific Instruments 77 (4) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.2190208 00346748 http://scholarbank.nus.edu.sg/handle/10635/57344 000237136500004 Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	10.1063/1.2190208
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING Luo, T. Khursheed, A.
format	Article
author	Luo, T. Khursheed, A.
spellingShingle	Luo, T. Khursheed, A. Second-order aberration corrected electron energy loss spectroscopy attachment for scanning electron microscopes
author_sort	Luo, T.
title	Second-order aberration corrected electron energy loss spectroscopy attachment for scanning electron microscopes
title_short	Second-order aberration corrected electron energy loss spectroscopy attachment for scanning electron microscopes
title_full	Second-order aberration corrected electron energy loss spectroscopy attachment for scanning electron microscopes
title_fullStr	Second-order aberration corrected electron energy loss spectroscopy attachment for scanning electron microscopes
title_full_unstemmed	Second-order aberration corrected electron energy loss spectroscopy attachment for scanning electron microscopes
title_sort	second-order aberration corrected electron energy loss spectroscopy attachment for scanning electron microscopes
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/57344
_version_	1781781391801843712

Second-order aberration corrected electron energy loss spectroscopy attachment for scanning electron microscopes

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