Multi-beam ion/electron spectra-microscope

US7947951

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Bibliographic Details
Main Author:	KHURSHEED, ANJAM
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Patent
Published:	2012
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/32794
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-32794
record_format	dspace
spelling	sg-nus-scholar.10635-327942015-07-29T07:04:03Z Multi-beam ion/electron spectra-microscope KHURSHEED, ANJAM ELECTRICAL & COMPUTER ENGINEERING NATIONAL UNIVERSITY OF SINGAPORE US7947951 Granted Patent 2012-05-02T02:30:31Z 2012-05-02T02:30:31Z 2011-05-24 Patent KHURSHEED, ANJAM (2011-05-24). Multi-beam ion/electron spectra-microscope. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/32794 NOT_IN_WOS PatSnap
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
description	US7947951
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING KHURSHEED, ANJAM
format	Patent
author	KHURSHEED, ANJAM
spellingShingle	KHURSHEED, ANJAM Multi-beam ion/electron spectra-microscope
author_sort	KHURSHEED, ANJAM
title	Multi-beam ion/electron spectra-microscope
title_short	Multi-beam ion/electron spectra-microscope
title_full	Multi-beam ion/electron spectra-microscope
title_fullStr	Multi-beam ion/electron spectra-microscope
title_full_unstemmed	Multi-beam ion/electron spectra-microscope
title_sort	multi-beam ion/electron spectra-microscope
publishDate	2012
url	http://scholarbank.nus.edu.sg/handle/10635/32794
_version_	1681081288011808768

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