Application of biased scanning probe microscopy techniques for multifunctional characterization of BiFeO3 and ZnO thin films

Ph.D

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Bibliographic Details
Main Author:	AMIT KUMAR
Other Authors:	MECHANICAL ENGINEERING
Format:	Theses and Dissertations
Language:	English
Published:	2012
Subjects:	Biased SPM, Multifunctional material, BFO, ZnO, Ferroelectric-like
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/33371
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Institution:	National University of Singapore
Language:	English

id	sg-nus-scholar.10635-33371
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spelling	sg-nus-scholar.10635-333712015-01-24T06:47:00Z Application of biased scanning probe microscopy techniques for multifunctional characterization of BiFeO3 and ZnO thin films AMIT KUMAR MECHANICAL ENGINEERING ZENG KAIYANG Biased SPM, Multifunctional material, BFO, ZnO, Ferroelectric-like Ph.D DOCTOR OF PHILOSOPHY 2012-05-31T18:02:58Z 2012-05-31T18:02:58Z 2011-08-15 Thesis AMIT KUMAR (2011-08-15). Application of biased scanning probe microscopy techniques for multifunctional characterization of BiFeO3 and ZnO thin films. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/33371 NOT_IN_WOS en
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
language	English
topic	Biased SPM, Multifunctional material, BFO, ZnO, Ferroelectric-like
spellingShingle	Biased SPM, Multifunctional material, BFO, ZnO, Ferroelectric-like AMIT KUMAR Application of biased scanning probe microscopy techniques for multifunctional characterization of BiFeO3 and ZnO thin films
description	Ph.D
author2	MECHANICAL ENGINEERING
author_facet	MECHANICAL ENGINEERING AMIT KUMAR
format	Theses and Dissertations
author	AMIT KUMAR
author_sort	AMIT KUMAR
title	Application of biased scanning probe microscopy techniques for multifunctional characterization of BiFeO3 and ZnO thin films
title_short	Application of biased scanning probe microscopy techniques for multifunctional characterization of BiFeO3 and ZnO thin films
title_full	Application of biased scanning probe microscopy techniques for multifunctional characterization of BiFeO3 and ZnO thin films
title_fullStr	Application of biased scanning probe microscopy techniques for multifunctional characterization of BiFeO3 and ZnO thin films
title_full_unstemmed	Application of biased scanning probe microscopy techniques for multifunctional characterization of BiFeO3 and ZnO thin films
title_sort	application of biased scanning probe microscopy techniques for multifunctional characterization of bifeo3 and zno thin films
publishDate	2012
url	http://scholarbank.nus.edu.sg/handle/10635/33371
_version_	1681081345648885760

Application of biased scanning probe microscopy techniques for multifunctional characterization of BiFeO3 and ZnO thin films

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