Integrated Metrology and Real-Time CD Control
Ph.D
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Language: | English |
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2012
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/33396 |
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sg-nus-scholar.10635-333962024-10-26T03:25:59Z Integrated Metrology and Real-Time CD Control NGO YIT SUNG ELECTRICAL & COMPUTER ENGINEERING TAY EE BENG, ARTHUR real-time control, critical dimensions, spectroscopic ellipsometry, advanced process control, post-exposure bake, lithography Ph.D DOCTOR OF PHILOSOPHY 2012-05-31T18:03:37Z 2012-05-31T18:03:37Z 2012-01-17 Thesis NGO YIT SUNG (2012-01-17). Integrated Metrology and Real-Time CD Control. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/33396 NOT_IN_WOS en |
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National University of Singapore |
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NUS Library |
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Asia |
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Singapore Singapore |
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NUS Library |
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ScholarBank@NUS |
language |
English |
topic |
real-time control, critical dimensions, spectroscopic ellipsometry, advanced process control, post-exposure bake, lithography |
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real-time control, critical dimensions, spectroscopic ellipsometry, advanced process control, post-exposure bake, lithography NGO YIT SUNG Integrated Metrology and Real-Time CD Control |
description |
Ph.D |
author2 |
ELECTRICAL & COMPUTER ENGINEERING |
author_facet |
ELECTRICAL & COMPUTER ENGINEERING NGO YIT SUNG |
format |
Theses and Dissertations |
author |
NGO YIT SUNG |
author_sort |
NGO YIT SUNG |
title |
Integrated Metrology and Real-Time CD Control |
title_short |
Integrated Metrology and Real-Time CD Control |
title_full |
Integrated Metrology and Real-Time CD Control |
title_fullStr |
Integrated Metrology and Real-Time CD Control |
title_full_unstemmed |
Integrated Metrology and Real-Time CD Control |
title_sort |
integrated metrology and real-time cd control |
publishDate |
2012 |
url |
http://scholarbank.nus.edu.sg/handle/10635/33396 |
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